Yazar "Yıldız, D. E." için listeleme
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Determination of current transport characteristics in Au-Cu/CuO/n-Si Schottky diodes
Bayraklı Sürücü, Özge; Güllü, Hasan Hüseyin; Terlemezoğlu, Makbule; Yıldız, D. E.; Parlak, Mehmet (Elsevier B.V., 2019)In this study, the material properties of CuO thin films fabricated by sputtering technique and electrical properties of CuO/n-Si structure were reported. Temperature-dependent current-voltage (I-V) measurement was carried ... -
Electrical characterization of CdZnTe/Si diode structure
Balbasi, C.D.; Terlemezoğlu, Makbule; Güllü, H. H.; Yıldız, D. E.; Parlak, Mehmet (Springer, 2020)Temperature-dependent current-voltage (I- V) , and frequency dependent capacitance-voltage (C- V) and conductance-voltage (G- V) measurements were performed in order to analyze characteristics of CdZnTe/Si structure. ... -
Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure
Güllü, H. H.; Bayraklı Sürücü, Özge; Terlemezoğlu, Makbule; Yıldız, D. E.; Parlak, Mehmet (Springer New York LLC, 2019)In/Cu 2 ZnSnTe 4 /Si/Ag diode structure was fabricated by sputtering Cu 2 ZnSnTe 4 (CZTTe) thin film layer on the Si layer with In front contact. The frequency dependent room temperature capacitance and conductance ... -
Investigation of carrier transport mechanisms in the Cu-Zn-Se based hetero-structure grown by sputtering technique
Güllü, H. H.; Terlemezoğlu, Makbule; Bayraklı Sürücü, Özge; Yıldız, D. E.; Parlak, Mehmet (Canadian Science Publishing, Nrc Research Press, 2018)In this paper, we present results of the electrical characterization of n-Si/p-Cu-Zn-Se hetero-structure. Sputtered film was found in Se-rich behavior with tetragonal polycrystalline nature along with (112) preferred ... -
Investigation of electrical characteristics of Ag/ZnO/Si sandwich structure
Güllü, H. H.; Bayraklı Sürücü, Özge; Terlemezoğlu, Makbule; Yıldız, D. E.; Parlak, Mehmet (Springer New York LLC, 2019)In this study, temperature-dependent current–voltage (I–V), frequency-dependent capacitance–voltage (C–V) and conductance–voltage (G/ ?- V) measurements are carried out for the electrical characterization of a zinc oxide ... -
Temperature dependence of electrical properties in In/Cu 2 ZnSnTe 4 /Si/Ag diodes
Güllü, H. H.; Yıldız, D. E.; Bayraklı Sürücü, Özge; Terlemezoğlu, Makbule; Parlak, Mehmet (Indian Academy of Sciences, 2019)Cu 2 ZnSnTe 4 (CZTTe) thin films with In metal contact were deposited by thermal evaporation on monocrystalline n-type Si wafers with Ag ohmic contact to investigate the device characteristics of an In/CZTTe/Si/Ag diode. ...